論文・研究発表

論文・研究発表

  1. Measurement of Hazardous Heavy Elements in Soil Using Uper High-Sensitive X-ray Fluorescence Aanalysis,
    K. Muraoka, T. Utaka and K. Taniguchi, Advances in X-ray Chemical Analysis Japan, (2007)
  2. Analysis of Light Elements Using a Compact EDXRF,
    Y. Matano, K. Muraoka, T. Utaka, S. Nomura, I. Nakai and K. Taniguchi,Advances in X-ray Chemical Analysis Japan, (2007)
  3. Detection of α Particles with a Superconductin Series-Junction Detector,
    M. Kurakado, E.C. Kirk, H. Sato, I. Jerjen, S. Shiki, H. M. Shimizu, A.
    Zehnder and K. Taniguchi, Nuclear Instruments & Methods in Physics Research A , 599 480-482 (2007)
  4. Analysis of Hazardous Heavy Element Cadmium in Environmental Specimen Using a Small-sized High Voltage X-ray Tube,
    Y. Matano, T. Utaka, T. Ninomiya, S. Nomura, Y. Isse, C. Numako and K. Taniguchi, Advances in X-ray Chemical Analysis, Japan 37, 109-120 (2006)
  5. Analysis of Hazardous Heavy Elements in Soil Using High-Sensitive X-ray Fluorescence Analysis,
    K. Muraoka, T. Utaka and K. Taniguchi,Advances in X-ray Chemical Analysis, Japan 37, 99-107 (2006)
  6. Development of a Portable Energy Dispersive X-ray Diffractometer and OnSite Analysis at an Excavation Site in Egypt,
    K. Kumagi, A. Hokura, I. Nakai, T. Utaka, K. Taniguchi and S. Yoshimura,Advances in X-ray Chemical Analysis, Japan 37, 257-272
  7. Active region of x-ray emission,
    T. Mukoyama and K. Taniguchi,X-ray Spectrometry 34, 240-244 (2006)
  8. Excitation Energy Dependence for the Li 1s X-ray Photoelectron Spectraof LiMn2O4,
    J. Tsuji, M. Fujita, Y. Haruyama, K. Kanda, S. Matsui, N. Ozawa, T. Yao and K. Taniguchi,Analytical Sciences 21, 779-781 (2005)
  9. EDS・極低温EDSの最新技術と応用,
    K. Taniguchi,「電子ビームを用いたアナリシス」, (2005)
  10. Active Region of X-ray Emission,
    T. Mukoyama and K. Taniguchi,X-ray Spectrometry, 34 240-244 (2005)
  11. Excitation Energy Dependence for the Li 1s X-ray Photoelectron Spectra of LiMn2O4,
    J. Tsuji, M. Fujita, Y. Haruyama, K. Kanda, S. Matsui, N. Ozawa, T. Yao and K. Taniguchi,Analytical Sciences, 21 779-781 (2005)
  12. Detection of αParticles with a Superconducting Series-Junction Detector,
    M. Kurakado, E.C. Kirk, H. Sato, I Jerjen, S. Shiki, H.M. Shimizu, A. Zehnder and K. Taniguchi, Elsevier Science, (2005)
  13. Identification of sub-Micron Particle by XRF,
    S. Maeo, T. Kurokawa, T. Toyota, K. Aikoh, I. Hourai and K. Taniguchi,Adv. X-ray. Chem. Anal., Japan 35 151-161 (2004)
  14. Studies of XPS Spectra for Lithium Compounds,
    K. Maeda, Y. Iwata, M. Fujita, J. Tsuji, Y. Haruyama, K. Kanda, S. Matsui, N. Ozawa, T. Yao and K. Taniguchi, Adv.
    X-ray. Chem. Anal., Japan 35, 137-150 (2004)
  15. Study of Charge-Discharge Cycle of Positive Electrode Materials of Lithium-ion Rechargeable Battery (LiMn2O4) by Means of XPS excited by Ultra Soft X-rays,
    M. Hujita, K. Kobayashi, K. Maeda, J. Tsuji, Y. Haruyama, K. Kanda, S. Matsui, N. Ozawa, T. Yao and K. Taniguchi, Adv. X-ray. Chem. Anal. Japan 35 163-170 (2004)
  16. Two-Dimensional Position Resolution and Correction of Position Dependence of Pulse Heights of Superconducting Series-Junction Detectors,
    M. Kurakado, S. Kamihirata, A. Kagamihata, K. Hirota, H. Hashimoto, H. Sato, H. Hotchi, H. M. Shimizu and
    K. Taniguchi, Nuclear Instruments and Methods in Physics Research A506 134-142 (2003)
  17. On site Analysis of Archaeological Samples at the Abu sir South Hill Remains in Egypt by Newly Developed Portable X-ray Fluorescence Spectrometer,
    T. Sanada, A. Hokura, I. Nakai, S. Maeo, S. Nomura, K. Taniguchi, T. Utaka, and S. Yoshimura,Adv. X-ray. Chem. Anal. Japan 34 289-306 (2003)
  18. Development of Portable X-ray Diffractometer,
    S. Maeo, I. Nakai, S. Nomura, H. Yamao and K. Taniguchi, Adv. X-ray. Chem. Anal,. Japan 34 125-132 (2003)
  19. Microscopic Discrimination of Nacreous Nail Enamels,
    T. Mukai, M. Kusatani, S. Nomura and K. Taniguchi, 鑑識科学, 7(2), 139-144 (2003)
  20. Development of Superconducting Series-Junction Detectors,
    M. Kurakado, S. Kamihirata, A. Kagamihata, K. Taniguchi and H. M. Shimizu, RIKEN Review 47 (2002)
  21. Lithium K-edge XANES Spectra for Lithium Compounds,
    J. Tsuji, H. Nakamatsu, T. Mukoyama, K. Kojima, S. Ikeda and K. Taniguchi,X-ray Spectrom. 31 319-326 (2002)
  22. X線で遺跡を鑑る
    K. Taniguchi,エジプトを掘る それをめぐる様々な学問分野, 142-151 (2001)
  23. Li K-edge Spectra of Lithium Halides,
    J. Tsuji, K. Kojima, S. Ikeda, H. Nakamatsu, T. Mukoyama and K. Taniguchi,J. Synchrotron Rad. 8 554-556 (2001)
  24. Kβ/Kα X-ray Intensity Rations in 3D Elements by Photoionization and Electron-Capture Decay,
    T. Mukoyama, K. Taniguchi and H. Adachi,Advances in Quantum Chemistry 37 (2001)
  25. Two-Dimensional Position Resolution and Correction of Incidence Position Dependency of Signal Heights of Series-Junction Detectors,
    S. Kamihirata, M. Kurakado, A. Kagamihata, K. Hirota, H. Hashimoto, R. Katano, K. Taniguchi, H. Sato, Y. Takizawa,
    C. Otani and H.M. Shimizu,AIP Conference Proceedings 605 149-152 (2001)
  26. Development of Portable X-ray Analyzer (XRF/XRD) for Field Studies,
    S. Maeo, S. Nomura, K. Taniguchi, 10th APCNDT BRISBANE (2001)
  27. M-shell Satellite Structure of W W-ray Emission Lines,
    A.M. Vlaicu, Y. Ito, K. Taniguchi, T. Mukoyama, and T. Bastug, Radiation Physics and Chemistry 61 401-403 (2001)
  28. Single-atom Approximation for Kβ-to-Kα X-ray Intensity Rations In Chemical Compounds of 3D Elements,
    T. Mukoyama, K. Taniguchi and H. Adachi, Physical Review A 63 042514 (2001)
  29. Probability of Nuclear Excitation by Electron Transition in Os Atoms,
    K. Aoki, K. Tanimoto, M. Terasawa, H. Yamaoka, M. Tosaki, Y. Ito, A.M. Vlaicu, K. Taniguchi, and J. Tsuji, Physical Review C, 64 044609 (2001)
  30. Li-K Absorption Spectra of Various Li Compounds,
    J. Tsuji, K. Kojima, S. Ikeda, H. Nakamatsu, T. Mukoyama and K. Taniguchi, Adv. X-ray. Chem. Anal., Japan 31 149-158 (2000)
  31. Touch-free in Situ Investigation of Ancient Egyptian Pigments,
    M. Uda, S. Sasa, K. Taniguchi, S. Nomura, S. Yoshimura, J. Kondo, N. Iskander, and B. Zaghloul, Naturwissenchaften 87 260-263 (2000)
  32. Improvement of Detection Limit for EDXRF,
    T. Minobayashi, M. Yamada, S. Nomura, T. Utaka and K. Taniguchi, Advances in X-ray Analysis 31 159-171 (2000)
  33. Variation of Kβ/ Kα X-ray intensity rations in 3d Elements,
    T. Mukoyama, K. Taniguchi and H. Adachi, C-ray Spectrometry 29 426-429 (2000)
  34. X-ray Analysis of Pigments on Ancient Egyptian Monuments,
    M. Uda, S. Sasa, T. Yoshioka, K. Taniguchi, S. Nomura, S. Yoshimura, J.Kondo, M. Nakamura, N. Iskandar and
    B. Zaghloul, International Journal of PIXE 9 441-451 (1999)
  35. A new N-channel Junction Field-Effect Transistor Embedded in the I Layer of a Pin Diode,
    H. Matsuura, K. Akatani, M. Ueda, K. Segawa, H. Tomozawa, K. Nishida and K. Taniguchi, Jpn. J. Appl. Phys, 38 1015-1017 (1999)
  36. Relativistic Calculations of X-ray Transition Energies and Emission Rates for Titanium Atoms,
    T. Mukoyama, B. Song and K. Taniguchi, X-ray spectrum 28 99-104 (1999)
  37. Quantification of TXRF Analysis,
    I. Szaloki, T. Utaka, Y. Tsuji and K. Taniguchi, JCPDS-International Centre for Diffraction Data, 41 812-821 (1999)
  38. Calculations of X-ray Emission Spectra for Sulfur Dioxide by the DV-XαMethod,
    B. Song, H. Nakamatsu, A. Shigemi, T. Mukoyama and K. Taniguchi, X-ray Spectrom 28 94-98 (1999)
  39. Atomic Excitation and Ionization as the Result of Inner-Shell Vacancy Creation,
    T. Mukoyama, Y. Ito and K. Taniguchi, X-ray Spectrom 28 491-496 (1999)
  40. Sulfur K-Edge X-ray Absorption Spectra of SF6, H2 and SO2,
    J. Tsuji, K. Kojima, H. Nakamatsu, T. Mukoyama, S. Ikeda and K. Taniguchi, Memories of the SR Center, 1 3-9 (1999)
  41. Born K-Edge XANES Spectra of Borate Glasses and Crystals,
    K. Taniguchi, Memories of the SR Center, 1 11-14 (1999)
  42. Analysis of Light Elements on Si Wafer by Capor-Phase Decomposition / Total Reflection X-ray Fluorescence,
    M. Yamagami, M. Nonoguchi, T. Yamada, T. Shoji, T. Utaka, Y. Mori, S. Nomura, K. Taniguchi, H. Wakita and S. Ikeda, Bunseki Kagaku 48 1005-1011 (1999)
  43. VPD / TXRF Analysis of Trace Elements on a Silicon Wafer,
    M. Yamagami, M. Nonoguchi, T. Yamada, T. Shoji, T. Utaka, S. Numura, K. Taniguchi, H. Wakita and S. Ikeda,X-ray Spectrometry 28 451-455 (1999)
  44. Valence Band Structures of Titanium Nitride and Titanium Carbide Calculated with Chemically Complete Clusters,
    B. Song, H. Nakamatsu, R. Sekine, T. Mukoyama and K. Taniguchi, J. Phys. Condens. Matter 10 9443-9454 (1998)
  45. Material Analysis End Station of the Hyogo-ken Beam Line at SPring-8,
    T. Kaneyoshi, T. Ishihara, H. Yoshioka, M. Motoyama, S. Fukushima, K. Hayashi,J. Kawai, K. Taniguchi, S. Hayakawa and Y. Gohshi, Journal of Synchrotron Radiation 5, 509-511 (1998)
  46. Study of Valence Band Structure for TiO2 (rutile) with DV-Xα Calculations and Soft X-ray Emission Spectra,
    K. Taniguchi, Adv. X-ray. Chem. Anal., Japan 29 191-202 (1998)
  47. Development of Handy Type X-ray Fluorescence Spectrometer,
    M. Hirai, T. Utaka, Y. Sako, A. Nisawa, S. Nomura and K. Taniguchi, Adv. X-ray. Chem. Anal., Japan 29 93-104 (1998)
  48. Ultra Soft X-ray Monochromator of Compact Light Source at Ritsumeikan University,
    Y. Tsuji, J. Tsuji, Y. Nakane, B. Song, S. Ikeda and K. Taniguchi, Adv. X-ray. Chem. Anal., Japan 29 23-32 (1998)
  49. New Design of the Small-Angle X-ray Scattering Spectrometer using Point Focus Optical System,
    S. Murakami, Y. Hirata, T. Murakami, S. Kojima, M. Noguchi and K. Taniguchi,Beam Science and Technology 3 5-9 (1998)
  50. Theoretical Estimation of the Chemical Effect on K X-ray Intensity Rations for 4d Elements,
    T. Mukoyama, H. Kaji, K. Taniguchi and H. Adachi, X-ray Spectrometry 26 269-571 (1997)
  51. Soft X-ray Monochromator of Compact Light Source at Ritsumeikan University,
    Y. Nakane, J. Tsuji, Y. Tsuji, B. Song, K. Kojima, S. Ikeda and K. Taniguchi, Advances in X-ray Analysis 29 33-45 (1997)
  52. Development of Energy Dispersive X-ray Fluorescence Spectrometer with monochromatic Excitation for the direct determination of Trace Elements in Organic Matrices,
    T. Wakisaka, N. Morita, M. Wakasa, S. Terada, K. Nishihagi and K. Taniguchi, Bunseki Kagaku 45 933-939 (1996)
  53. 可搬型蛍光X線分析装置の開発,
    K. Taniguchi, S. Nomura, and T. Ninomiya, Isotope News 7 6-8 (1996)
  54. An Upper Limit for the Probability of Nuclear Excitation by Electron Transition in 235U,
    A. Shinohara, T. Saito, K. Taniguchi, K. Otozai, S. Ikeda and H. Baba,Chemistry Letters 19-20 (1995)
  55. Applications of a Glazing Incidence X-ray Fluorescence Analysis to Forensic Samples,
    T. Ninomiya, S. Nomura, K. Taniguchi and S. Ikeda, Analytical Sciences 11 489-494 (1995)
  56. International Workshop on New Opportunities in Soft X-ray Emission Spectroscopy,
    K. Taniguchi, 放射光, 8 98-100 (1995)
  57. Observation of a Layer Structure in Ti-U-O System,
    C. Miyake, D. Sugiyama, and K. Taniguchi, Journal of Nuclear Science and Technology, 31 1053-1059 (1994)
  58. 科学捜査:残された証拠を探る-全反射蛍光X線分析法の応用-,
    S. Nomura, T. Ninomiya, and K. Taniguchi, ‘94活躍する大阪電通大OB, 5 (1994)
  59. XAFS Studies of Amorphous Silicon Nitride,
    N. Umesaki, N. Kamijo, I. Tanaka, K. Nihara, A. Hatta and K. Taniguchi, Adv. X-ray. Chem. Anal., Japan 25 121-130 (1994)
  60. X線を用いた表面解析,
    K. Taniguchi,大阪電気通信大学研究論集「自然科学編」29 13-25 (1994)
  61. 全反射蛍光X線分析,
    K. Taniguchi, 金属, Oct 13-17 (1994)
  62. Oxidation States of U and Ti in U-Ti-O Ternary Mixed Oxides,
    C. Miyake, D. Sugiyama and K. Taniguchi,Actinides 94’ (1994)
  63. Double Flat Crystal Spectrometer in Dispersive Arrangement for Laboratory XAFS Spectroscopy,
    Y. Uehara, M. Kataoka, T. Ogawma, A. Kawabata, K. Nishihagi and K.. Taniguchi, Jpn. J. Appl. Phys., 32 273-275 (1993)
  64. Total Reflection X-ray Fluorescence Spectrometry,
    K. Taniguchi, Bunseki 3 168-173 (1993)
  65. Status of Solid State Energy Dispersive X-ray detection,
    K. Tanigchi,Nuclear Instruments and Methods in Physics Research, B75 91-98 (1993)
  66. Total reflection X-ray Fluorescence Spectrometry,
    K. Taniguchi, Bunseki Kagaku 3 168-173 (1993)
  67. Recent Improvements in Laboratory XAFS Facility,
    K. Nishihagi, A. Kawabata and K. Taniguchi, Jpn. J. Appl. Phys. 32 258-260 (1993)
  68. The Local Structure of Chromium (III) In The Mixed Glycerol Aqueous Solution,
    T. Watanabe, K. Taniguchi, T. Ninomiya and S. Ikeda, Advances in X-ray Analysis 35 1197-1203 (1992)
  69. Laboratory XAFS Spectrometer for X-ray Absorption Spectra of Light Elements,
    S. Yamashita, K. Taniguchi, S. Nomoto, T. Yamaguchi and H. Wakita,
    X-ray Spectrometry 21 91-97 (1992)
  70. 全反射蛍光X線分析法,
    S. Nomura, and K. Taniguchi, Isotope News Oct 7-10 (1992)
  71. Atomic Excitation an Ionizaion as The Result of Vacancy Production,
    T. Mukoyama and K. Taniguchi, Bulliten 70 1-9 (1992)
  72. Total Reflection X-ray Fluorescence Spectrometry,
    K. Taniguchi, and T. Ninomiya, Bunseki Kagaku, 2 129-134 (1992)
  73. Chemical State Analysis Usin a Gearless Two- Crystal X-ray Spectrometer,
    T. Konishi, K. Nishihagi and K. Taniguchi, Anvances in X-ray Analysis 35 393-399 (1992)
  74. Application of Total Reflection X-ray Fluorescence Spectrometry to Drug Analysis,
    S. Nomura, T. Ninomiya, K. Taniguchi and S. Ikeda, Advances in X-ray Analysis 35 969-974 (1992)
  75. Atomic Excitation and Ionizaion as the Result of Vacancy Production,
    T. Nukoyama and K. Taniguchi, Chemical Research, Kyoto University 70 1-9 (1992)
  76. Total Reflection X-ray Fluorescence,
    K.Taniguchi 化学工業, 2 45-50 (1992)
  77. Gearless Two-Crystal X-ray Spectrometer for Chemical State Analysis,
    T. Konishi, K. Nishihagi, and K. Taniguchi, Rev. Sci. Instrum. 62(11) 2588-2592 (1991)
  78. Influence of Exposure Time on the Sensitivity of Kodak 101 X-ray Film,
    H. Nishimura, K. Eidman, K. Sugimoto, W. Schwanda, T. Toyoda, K. Taniguchi, Y. Kato and S. Nakai, Journal of X-ray Science And Technology 3 14-18 (1991)
  79. X線を用いた表面解析,
    K. Taniguchi, 静電気学会誌 15(4) 265-270 (1991)
  80. Application of Total Reflection X-ray Fluorescence Spectrometry ot Elemental Toner Analysis,
    T. Ninomiya, S. Nomura, and K. Taniguchi, Japan Society of Color Material, 65 176-181 (1991)
  81. Non-destructive Elemental Analysis of Lipstick using Total Reflection X-ray Fluorescence Spectrometry,
    S. Nomura, T. Ninomiya and K. Taniguchi, 大阪電気通信大学研究論集 25 109-118 (1990)
  82. Characterization of X rays Emitted from 351-nm Laser-Produced Plasmas for X-ray Shadowgraphy,
    K. Kondo, H. Nishimura, K. Kondo, H. Hasegawa, Y. Kato, T. Yamanaka, K. Nakai, and K. Taniguchi, J. Appl. Phys. 67(6) (1990)
  83. Interatomic Contributions to Molecular X-ray Emission Rates,
    T. Mukoyama, K. Taniguchi, and H. Adachi, Physical Review B41 8118-8121 (1990)
  84. Probing into Residual Forensic Evidences -Application of Total ReflectionX-ray Fluorescence Spectrometry-
    T. Ninomiya, S. Nomura and K. Taniguchi, Journal of The Surface Science Society of Japan 11 37-42 (1990)
  85. Mutual Oxidation States of Uranium and Molybdenum in U-Mo-O Ternary Oxides,
    C. Miyake, M. Matsumura and K. Taniguchi, Journal of Less-Common Metals 163 133-141 (1990)
  86. Total Reflection X-ray Fluorescence Spectrometry,
    Kazuo Taniguchi and Toshio Ninomiya, 鋼と鉄, 8 26-34 (1990)
  87. Characterization of Uranium Oxide Thin Film Trepared by Vacuum Deposition Method,
    C. Miyake, Y. Yoneda, M. Matsumura, T. Iida, K. Taniguchi, T.Yamanaka,M. Yamanaka and T. Yamamoto, Journal of Nuclear Science and Technology 27 382-385 (1990)
  88. Quantitative Analysis of Arsenic Element in a Trace of Water using Total Reflection X-ray Fluorescence Spectrometry,
    T. Ninomiya, S. Nomura, K. Taniguchi and S. Ikeda, Advances in X-ray Analysis 32 197-204 (1989)
  89. Trace Element Analysis of Aqueous Solution using Total Reflection X-ray Fluorescence,
    T. Imakita, A. Kimura, K. Nishihagi, Y. Inokuma and K. Taniguchi, Advances in X-ray Analysis 19 237-249 (1998)
  90. Elemental Analysis of Trace Plastic Residuals using Total Reflection X-ray Fluorescence Analysis,
    T. Ninomiya, S. Nomura and K. Taniguchi, Advances in X-ray Analysis 19 227-235 (1987)
  91. Trace Element Analysis of Titanium Oxide Pigments using Total Reflection X-ray Fluorescence Analysis,
    S. Nomura, T. Ninomiya and K. Taniguchi, Advances in X-ray analysis 19 217-226 (1987)
  92. Chemical Effects of K-X-ray Spectrum,
    K. Taniguchi, T. Mukoyama and H. Aadachi, Journal De Physique 47 C9-757-C9760 (1987)
  93. Atomic Excitation as the result of Inner-shell Vacancy Production,
    T. Mukoyama and K. Taniguchi, Physical Review A 36 693-698 (1987)
  94. Nuclear Excitation in 189Os With Synchrotron Radiation,
    A. Shinohara, T. Saito, M. Shoji, A. Yokoyama, H. Baba, M. Ando and K.Taniguchi, Nuclear Physics A472 151-160 (1987)
  95. Oxidation States of U and Nb in U-Nb-O Ternary Oxides by Means of Magnetic Susceptibility, XPS and EsR,
    C. Miyake, S. Ohana, S. Imoto and K. Taniguchi, Inorganica Chimica Acta 140 133-135 (1987)
  96. Characterization of Silicon Compounds using the Auger Parameter in X-ray Photoelectron Spectroscopy,
    S. Kohiki, S. Ozaki, T. Hamada and K. Taniguchi, Applied Surface Science 28 103-110 (1987)
  97. Microanalysis using Total-Reflection X-ray Fluorescence,
    S. Nomura, M. Yamashita and K. Taniguchi, 大阪電気通信大学研究論集「自然科学編」 22 87-98 (1986)
  98. Exafs and Xanes Study on Rare-Earth Chromites of Gd1_SrxCrO3 (x=0, 0.2, 0.5),
    N. Kamijo, H. Kageyama, M. Narukawa, F. Maruyama, Y. Nakao, K. Taniguchi and H. Maeda, Journal de Physique 47 C8-761-C8764 (1986)
  99. Exafs and Xanes Studies on La1_xSrxCo03 Compounds (x=0, 0.2, 0.5),
    H. Kageyama, N. Kamijo, M. Narukawa, F. Maruyama, Y. Nakao and K. Taniguchi,Journal de Physique 47 C8-757-C8-760 (1986)
  100. Chemical Effect on Kβ:Kα X-ray Intensity Rations,
    T. Mukoyama, K. Taniguchi and H. Adachi, Physical Review B 34 3710-3716 (1986)
  101. Laboratory EXAFS and its Applications at Soft X-ray Region,
    Y. Nakao and K. Taniguchi,大阪電気通信大学研究論集「自然科学編」22 59-68 (1986)
  102. Application of Total Reflection X-ray Fluorescence Analysis to Forensic Model Samples,
    T. Ninomiya, S. Nomura and K. Taniguchi, 大阪電気通信大学研究論集「自然科学編」22 51-58 (1986)
  103. Compatible Software Written in C Language,
    K. Ueda, S. Nomura, H. Yamashita and K. Taniguchi, 大阪電気通信大学研究論集「自然科学編」22 35-42 (1986)
  104. Laboratory EXAFS,
    K. Taniguchi and Y. Nakao, Advances in X-ray Chemical Analysis Japan 17 215-227 (1986)
  105. A Self-Scanning Photodiode Array and its Application to an X-ray Spectrometer,
    K. Taniguchi, X-ray Instrumentation Dynamic Analyses of Micro Structures in Matter 127-136(1986)
  106. X-ray Photoelectron Spectroscopy of U1-xGdxO2 Solid Solution,
    C. Miyake, M. Kanamaru, S. Imoto and K. Taniguchi, Journal of Nuclear Materials 138 36-39 (1986)
  107. ラボラトリーEXAFS装置の試作と評価,
    K. Taniguchi, and Y. Nakao, Advances in X-ray Chemical and Analysis Japan 17 215-227 (1986)
  108. X-ray Photoelectron Spectroscopy Excited by Zr-Mζ for Studies on Valence Bands Structure,
    S. Nomura and K. Taniguchi, 大阪電気通信大学研究論集「自然科学編」 21 61-70 (1985)
  109. Laboratory EXAFS and its Applications,
    Y. Nakao, T. Ban and K. Taniguchi, 大阪電気通信大学研究論集「自然科学編」 21 71-82 (1985)
  110. X-ray Photoelectron Spectroscopy by ZrMζ for Studies on Valence Band Structure,
    K. Taniguchi and S. Nomura, Advances in X-ray Chemical Analysis Japan 17 61-70 (1985)
  111. Self-Scanning Photodiode Array as X-ray detector and its Application to EXAFS,
    K. Taniguchi, N. Yamaki and S. Ikeda, Japanese Journal of Applied Physics 23 909-912 (1984)
  112. Chemical-state Analysis by Means of Soft X-ray Spectroscopy. Ⅱ. Kβ Spectra for Phosphorus, Sulfur, and Chlorine in Various Compounds,
    K. Taniguchi, Bulletin of the Chemical Society of Japan, 57 915-920 (1984)
  113. Chemical-state Analysis by Means of Soft X-ray Spectroscopy. I. L23-Emission Spectra for Phosphorus, Sulfur, and Chlorine in Various Compounds,
    K. Taniguchi, Bulletin of the Chemical Society of Japan, 57 909-914 (1984)
  114. Chemical-state Analysis by Means of Soft X-ray Spectroscopy. Ⅲ. OKα Emission Spectra for Oxyanions in Different Salts,
    K. Taniguchi, Bulletin of the Chemical Society of Japan, 57 921-925 (1984)
  115. The Discrete Variational Calculations of the Overlap Integrals and the Dipole Matrix Elements,
    T. Mukoyama, K. Taniguchi and H. Adachi, Bulletin of the Institute for Chemical Research, 62 13-16 (1984)
  116. Soft X-ray Grating Spectrometer for Secondary-Excitation Using Synchrotron Radiation,
    K. Taniguchi, Japanese Journal of Applied Physics 23 358-363(1984)
  117. S-L2,3 Emission Spectra of Sulfur Compounds Excited by Synchrotron Radiation,
    K. Taniguchi, T. Ohta and M. Nomura,
  118. Simple Quasi-two-crystal X-ray Spectrometer,
    K. Taniguchi,Rev. Sci. Instrum 54(5) 558-562 (1983)
  119. Study of X-ray Spectra Using Discrete Variational Xα Cluster Method,
    K. Taniguchi and H. Adachi, Advances in X-ray analysis 14 131-147 (1982)
  120. X-ray Absorption Spectra of Uranium by Synchrotron Radiation,
    H. Adachi, K. Fujita, K. Taniguchi, C. Miyake and S. Imoto, Japanese Journal Applied Physics 20 612-614 (1981)
  121. Absolute Spectral Intensities of Photons Emitted by a Commercial X-ray Tube for Fluorescence Analysis,
    A. Shinohara, T. Saito, K. Otozai, K. Taniguchi and S. Ikeda, Osaka University Laboratory Nuclear Studies (1981)
  122. Calculations of X-ray Spectra using the Discrete Variational Xα Cluster Method,
    K. Taniguchi, Inner-Shell and X-ray Physics of Atoms and Solid 853-856 (1981)
  123. X-ray Absorption Spectra of Uranium by Synchrotron Radiation,
    H. Adachi, K. Fujima, K. Taniguchi, C. Miyake and S. Imoto, Japanese Journal of Applied Physics 20 612-614 (1981)
  124. X-ray Spectrometer for EXAFS using a Position Sensitive Detector,
    K. Taniguchi, K. Oka, N. Yamaki and S. Ikeda (1981)
  125. EXAFSによるトレースキャラクタリゼーションのための状態分析法の研究,
    K. Taniguchi, and K. Kosai, 研究報告 102-103 (1981)
  126. Cl, S, and P-L2,3 Emission Spectra and Chemical State Analysis,
    K. Taniguchi, Advances in X-ray Analysis 12 1-11 (1981)
  127. New X-ray Detectors and Their Applications in Diffraction Studies,
    K. Taniguchi, National Laboratory for High Energy Physics 13-16 (1980)
  128. The EXAFS study of Cu(Ⅱ) Aqueous Solution using a Position Sensitive Detector,
    M. Sano, K, Taniguchi and H. Yamatera, 33 1285-1286 (1980)
  129. Calculation of X-ray Spectra using discrete Variational Xα Cluster Method,
    H. Adachi and K. Taniguchi, Technology Reports of the Osaka University 30 365-371 (1980)
  130. Effect of Chemical State upon Phosphorus-L2,3 Fluorescence Spectra,
    K. Taniguchi, Advances in X-ray Analysis 23 193-201 (1980)
  131. トレース・キャラクタリゼーションのための状態分析法の研究―EXAFSによる研究(2),
    K. Taniguchi and K. Kosai 研究報告88-89 (1980)
  132. Calculations of X-ray Spectra using Discrete Variational Xα Cluster Method,
    H. Adachi, and K. Taniguchi, Technology Reports of the Osaka University 30 365-371 (1980)
  133. X-ray Emission Spectra from Phosphorus Compounds,
    K. Taniguchi, 大阪電気通信大学研究論集「自然科学編」15 83-92 (1979)
  134. Molecular Orbital Studies of Chlorine Compounds by Cl-LⅡ,Ⅲ Emission Spectra andPhotoelectron Spectra,
    K. Taniguchi, K. Fujita, M. Soura, O. Iwasaki and H. Kaneko, 大阪電気通信大学研究論集「自然科学編」14 157-164 (1978)
  135. Calculation of the X-ray LⅡ,Ⅲ Spectra for NaClO2 Na ClO3, and NaClO4,
    K. Taniguchi, M.Mitsuzane, M. Shuden, H. Kanemori and T. Harada, 大阪電気通信大学研究論集「自然科学編」14 165-172 (1978)
  136. Experiment of the Optical Doppler Effect,
    M. Nakata, K. Taniguchi and K. Aoyagi, 大阪電気通信大学研究論集 12 13-20 (1976)
  137. Sulfur LⅡ,Ⅲ Emission Spectra and Molecular Orbital Studies of Sulfur Compounds,
    K.Taniguchi and Burton L. Henke, The Journal of Chemical Physics 64 3021-3035 (1976)
  138. Quantitative Low-Energy X-ray Spectroscopy (50-100A* region),
    K.Taniguchi, Journal of Applied Physics 47 1027-1037 (1976)
  139. Radiative Auger Effect with and without Electron Emission,
    M. Sawada, K. Taniguchi andT. Nakamura, Journal of the Physical Society of Japan 33 1496 (1972)
  140. The Intensities of Long Wavelength Satellite of Kβ Series and Two-Electron Jumps,
    M. Sawada, K. Taniguchi and H. Nakamura, 大阪電気通信大学研究論集「自然科学編」9 26-45(1972)

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